• AFM and SEM investigations of ion beam synthesized Mg2Si precipitates in Si substratesAngelov, Christo; Mikli, Valdek; Amov, Blagoj; Goranova, E.Journal of optoelectronics and advanced materials2005 / 1, p. 369-373 https://old.joam.inoe.ro/arhiva/pdf7_1/Angelov3.pdf
• AFM characterization of the surface morphology of the severe plastic deformed copper [Electronic resource]Hussainova, Irina; Lõhmus, Rünno; Kommel, Lembit; Siimon, H.Proceedings of Material Research Society Spring Meeting : March 28 - April 1, 2005, San Francisco, CA, USA2005 / [CD-ROM]
• An XPS and AFM study of polypyrrole coating on mild steelIdla, Katrin; Talo, A.; Niemi, H.E.-M.; Forsen, Olof; Yläsaari, SeppoSurface and interface analysis1997 / 9, [18] p.: ill
• An XPS and AFM study of polypyrrole coating on mild steelIdla, Katrin; Talo, A.; Niemi, H.; Forsen, Olof; Yläsaari, Seppo4th International Conference on Adhesion and Surface Analysis, Loughborough University, UK, April 16-18, 19961996 / abstract no. P27 https://www.researchgate.net/publication/243802279_An_XPS_and_AFM_study_of_polypyrrole_coating_on_mild_steel
• Nanomechanical characterisation of materials by atomic force microscopyKollo, LauriNanopowders, Nanostuctured Materials and Coatings : Network for Nanostructured Materials of ACC : March 17, 2005, Tallinn, Estonia : book of abstracts2005 / p. 27
• Structural investigations of ion beam synthesized [beeta]-FeSi2Angelov, Christo; Amov, Blagoj; Mikli, Valdek; Traksmaa, RainerJournal of optoelectronics and advanced materials2009 / 10, p. 1490-1493 https://www.researchgate.net/publication/286966891_Structural_investigations_of_ion_beam_synthesized_b-FeSi2
• Thermal annealing of sequentially deposited SnS thin filmsSafonova, Maria; Nair, Padmanabhan Pankajakshy Karunakaran; Mellikov, Enn; Aragon, Rebeca; Kerm, Karin; Naidu, Revathi; Mikli, Valdek; Volobujeva, OlgaProceedings of the Estonian Academy of Sciences2015 / p. 488-494 : ill https://doi.org/10.3176/proc.2015.4.04 https://www.scopus.com/sourceid/11500153303 https://www.scopus.com/record/display.uri?eid=2-s2.0-84955164442&origin=inward&txGid=6c958e1a0d3530e56fe15203f664f78a https://jcr.clarivate.com/jcr-jp/journal-profile?journal=P%20EST%20ACAD%20SCI&year=2015 https://www.webofscience.com/wos/woscc/full-record/WOS:000366503800004
• Use of atomic-force microscopy for characterization of silicon, implated with heavy ions at high dosesAngelov, Christo; Groudev, P.; Mikli, ValdekProceedings of 11th Conference "Materials for Information Tech. in the New Millenium" : ISCMP : Varna, 20012001 / p. 460-464