• Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuitsJenihhin, Maksim; Squillero, Giovanni; Tihhomirov, Valentin; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications (JETTA)2016 / p. 273-289 : ill https://doi.org/10.1007/s10836-016-5589-x https://www.scopus.com/sourceid/18040 https://www.scopus.com/record/display.uri?eid=2-s2.0-84966714453&origin=inward&txGid=3b4ba7ac260a393cbe6bed59b4d314b9 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=J%20ELECTRON%20TEST&year=2016 https://www.webofscience.com/wos/woscc/full-record/WOS:000377449900004
• Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPGPalermo, N.; Tihhomirov, Valentin; Copetti, Thiago; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102405