• A PL study of CIGS thin films imlanted with He and D ionsYakushev, M. V.; Martin, R. W.; Krustok, Jüri; Schock, H. W.; Pilkington, R. D.; Hill, A. E.; Tomlinson, R. D.Thin solid films2000 / p. 488-493
• APL study of CIGS thin films implanated with He and D ionsYakushev, M.; Pilkington, R. D.; Hill, A. E.; Tomlinson, R. D.; Martin, R. W.; Krustok, Jüri; Schock, H. W.E-MRS Spring Meeting : Strasbourg, 1999 : abstracts1999 / p. O http://staff.ttu.ee/~juri.krustok/PDF-s/TSF-488.pdf
• Effects of deuterium implantation on the optical properties of Cu(InGa)Se2Yakushev, M. V.; Martin, R. W.; Krustok, JüriThin solid films2001 / p. 201-204
• Optical properties of high quality Cu2ZnSnSe4 thin filmsLuckert, F.; Hamilton, D. I.; Yakushev, M. V.; Beattie, N. S.; Zoppi, G.; Moynihan, M.; Forbes, I.; Karotki, A. V.; Mudryi, A. V.; Grossberg, Maarja; Krustok, Jüri; Martin, R. W.Applied physics letters2011 / p. 062104 [3 p.] : ill
• Optical spectroscopy studies of Cu₂ZnSnSe₄ thin filmsYakushev, M. V.; Forbes, I.; Mudryi, A. V.; Grossberg, Maarja; Krustok, Jüri; Beattie, N. S.; Moynihan, M.; Rockett, A.; Martin, R. W.Thin solid films2015 / p. 154-157 : ill https://doi.org/10.1016/j.tsf.2014.09.010 https://www.scopus.com/sourceid/12347 https://www.scopus.com/record/display.uri?eid=2-s2.0-84926435469&origin=inward&txGid=4cb06c3599a91c94dc933abeccf628ed https://jcr.clarivate.com/jcr-jp/journal-profile?journal=THIN%20SOLID%20FILMS&year=2015 https://www.webofscience.com/wos/woscc/full-record/WOS:000352225900033
• Photoluminescence and tetragonal distortion in CuInSe2Yakushev, M. A.; Martin, R. W.; Krustok, JüriAbstracts E-MRS-IUMRS2000 / p. N-23
• Radiative recombination in Cu₂ZnSnSe₄ thin films with Cu deficiency and Zn excessYakushev, M. V.; Marquez-Prieto, J.; Forbes, I.; Edwards, P. R.; Zhivulko, V. D.; Mudryi, A. V.; Krustok, Jüri; Martin, R. W.Journal of physics D : applied physics2015 / p. 1-7 : ill https://doi.org/10.1088/0022-3727/48/47/475109 https://www.scopus.com/sourceid/28570 https://www.scopus.com/record/display.uri?eid=2-s2.0-84947093699&origin=inward&txGid=d14f61b2d29584b7d6482cfe213d90ef https://jcr.clarivate.com/jcr-jp/journal-profile?journal=J%20PHYS%20D%20APPL%20PHYS&year=2015 https://www.webofscience.com/wos/woscc/full-record/WOS:000367093500014