• A novel random approach to diagnostic test generationOsimiry, Emmanuel Ovie; Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark2016 / [4] p. : ill https://doi.org/10.1109/NORCHIP.2016.7792915
• A tool for random test generation targeting high diagnostic resolutionOsimiry, Emmanuel Ovie; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 79-82 : ill http://www.ester.ee/record=b2150914*est
• Versatile direct and transpose matrix multiplication with chained operations : an optimized architecture using circulant matricesIakymchuk, Taras; Rosado-Munoz, Alfredo; Mompean, Manuel Bataller; Villora, Jose Vicente Frances; Osimiry, Emmanuel OvieIEEE Transactions on Computers2016 / p. 3470 - 3479 https://doi.org/10.1109/TC.2016.2538235 https://www.scopus.com/sourceid/25033 https://www.scopus.com/record/display.uri?eid=2-s2.0-84994731604&origin=resultslist&sort=plf-f&src=s&sid=1ddaccc75e260944caf9758990c44eec&sot=b&sdt=b&s=DOI%2810.1109%2FTC.2016.2538235%29&sl=28&sessionSearchId=1ddaccc75e260944caf9758990c44eec&relpos=0 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20T%20COMPUT&year=2016 https://www.webofscience.com/wos/woscc/full-record/WOS:000388498000019