Non-destructive eddy current measurments for silicon carbide heterostructure analysis
Sahakyan, Armen
;
Koel, Ants
;
Rang, Toomas
Materials and contact characterisation VIII
2017
/
p. 49-60 : ill
https://doi.org/10.2495/MC170061
https://www.scopus.com/sourceid/6000195382
https://www.scopus.com/record/display.uri?eid=2-s2.0-85039058119&origin=inward&txGid=72f8ed67790fde317966170b760cdd41