Nanoscale and microscale simulations of N-N junction heterostructures of 3C-4H silicon carbide
Rashid, Muhammad Haroon
;
Koel, Ants
;
Rang, Toomas
;
Gähwiler, Reto
;
Grosberg, Martin
;
Jõemaa, Rauno
Materials and contact characterisation VIII
2017
/
p. 235-248 : ill
https://doi.org/10.2495/MC170241
https://www.scopus.com/sourceid/6000195382
https://www.scopus.com/record/display.uri?eid=2-s2.0-85039063073&origin=inward&txGid=ae51660a8a9b7f5fa98eaa8bca050af1