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• Mission profile-based accelerated testing of DC-link capacitors in photovoltaic invertersSangwongwanich, Ariya; Shen, Yanfeng; Chub, Andrii; Liivik, Elizaveta; Vinnikov, Dmitri; Wang, Huai; Blaabjerg, FredeThirty-Fourth Annual IEEE Applied Power Electronics Conference and Exposition, March 17 – 21, 2019, Anaheim, California2019 / p. 2833-2840 : ill https://doi.org/10.1109/APEC.2019.8721794 https://www.scopus.com/sourceid/31003 https://www.scopus.com/record/display.uri?eid=2-s2.0-85067102429&origin=inward&txGid=2745b6a6d53787c8201e71e41b44dd6a https://www.webofscience.com/wos/woscc/full-record/WOS:000475931102156
• Reliability evaluation of an impedance-source PV microconverterShen, Yanfeng; Liivik, Elizaveta; Blaabjerg, Frede; Vinnikov, Dmitri; Wang, Huai; Chub, Andrii17th International Symposium “Topical Problems in the Field of Electrical and Power Engineering”. Doctoral school of energy and geotechnology. III : Kuressaare, Estonia, January 15-20, 20182018 / p. 108-110 : ill http://ise.elnet.ee/record=b2950026~S2*est
• Reliability evaluation of an impedance-source PV microconverterShen, Yanfeng; Liivik, Elizaveta; Blaabjerg, Frede; Vinnikov, Dmitri; Wang, Huai; Chub, Andrii2018 IEEE Applied Power Electronics Conference and Exposition (APEC 2018), San Antonio, Texas, USA, 4-8 March 20182018 / p. 1104–1108 : ill https://doi.org/10.1109/APEC.2018.8341154 https://www.scopus.com/sourceid/31003 https://www.scopus.com/record/display.uri?eid=2-s2.0-85046961445&origin=inward&txGid=c53c63c11f97844f2154b630947cd99a https://www.webofscience.com/wos/woscc/full-record/WOS:000434981901045
• Reliability of DC-link capacitors in two-stage micro-inverters under different PV module sizesSangwongwanich, Ariya; Shen, Yanfeng; Chub, Andrii; Liivik, Elizaveta; Vinnikov, Dmitri; Wang, Huai; Blaabjerg, FredeICPE 2019 - ECCE Asia : 10th International Conference on Power Electronics - ECCE Asia : "Green World with Power Electronics" : May 27-30, 2019 BEXCO, Busan, Korea2019 / p. 1867-1872 : ill https://ieeexplore.ieee.org/xpl/conhome/8786807/proceeding
• Wear-out failure analysis of an impedance-source PV microinverter based on system-level electrothermal modelingShen, Yanfeng; Chub, Andrii; Wang, Huai; Vinnikov, Dmitri; Liivik, Elizaveta; Blaabjerg, FredeIEEE transactions on industrial electronics2019 / p. 3914-3927 https://doi.org/10.1109/TIE.2018.2831643 https://www.scopus.com/sourceid/26053 https://www.scopus.com/record/display.uri?eid=2-s2.0-85046350255&origin=inward&txGid=2b0aac53f97c84ec7d310d427b2c3415 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20T%20IND%20ELECTRON&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000455188700060