Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation
Oyeniran, Adeboye Stephen
;
Azad, Siavoosh Payandeh
;
Ubar, Raimund-Johannes
2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings
2018
/
5 p.: ill
https://doi.org/10.1109/ISCAS.2018.8350936
https://www.scopus.com/sourceid/56190
https://www.scopus.com/record/display.uri?eid=2-s2.0-85057101928&origin=inward&txGid=49e361500f6fe5902264fae2d90ceb95
https://www.webofscience.com/wos/woscc/full-record/WOS:000451218700050