• Accelerating transient fault injection campaigns by using Dynamic HDL SlicingBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore2019 / 7 p. : ill https://doi.org/10.1109/NORCHIP.2019.8906932
• Automated identification of application-dependent safe faults in automotive systems-on-a-chipsBagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sonza Reorda, Matteo; Hamdioui, Said; Jenihhin, Maksim; Sauer, ChristianElectronics2022 / art. 319 https://doi.org/10.3390/electronics11030319 https://www.scopus.com/sourceid/21100829272 https://www.scopus.com/record/display.uri?eid=2-s2.0-85122936454&origin=inward&txGid=5d6e8d72b1ef5e0219cb0f5191808c5d https://jcr.clarivate.com/jcr-jp/journal-profile?journal=ELECTRONICS-SWITZ&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000759878100001
• Combining fault analysis technologies for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings2019 / p. 129–134 : ill https://doi.org/10.1109/ATS47505.2019.00024
• Determined-safe faults identification : a step towards ISO26262 hardware compliant designsAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Sonza Reorda, Matteo; Hamdioui, Said; Sauer, Christian2020 25th IEEE European Test Symposium (ETS)2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131568
• Efficient fault injection based on dynamic HDL slicing techniqueBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece2019 / p. 52-53 : ill https://doi.org/10.1109/IOLTS.2019.8854419
• EFIC-ME : a fast emulation based fault injection control and monitoring enhancementAbideen, Zain Ul; Rashid, Muhammad HaroonIEEE Access2020 / p. 207705-207716 https://doi.org/10.1109/ACCESS.2020.3038198 https://www.scopus.com/sourceid/21100374601 https://www.scopus.com/record/display.uri?eid=2-s2.0-85097356103&origin=inward&txGid=2f1165cb9a49c99935e3d326b2af989d https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20ACCESS&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000595015400001
• Machine learning to tackle the challenges of transient and soft errors in complex circuitsLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Greece2019 / p. 7-14 : ill https://doi.org/10.1109/IOLTS.2019.8854423
• On the estimation of complex circuits functional failure rate by machine learning techniquesLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings2019 / p. 35-41 : ill https://doi.org/10.1109/DSN-S.2019.00021
• Representing gate-level SET faults by multiple SEU faults on RT-levelBagbaba, Ahmet Cagri; Jenihhin, Maksim; Ubar, Raimund-Johannes; Sauer, Christian2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings2020 / art. 19889351, 6 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159715
• SALSy : security-aware layout synthesisEslami, Mohammad; Perez, Tiago Diadami; Pagliarini, Samuel NascimentoarXiv.org2024 / 13 p. : ill https://doi.org/10.48550/arXiv.2308.06201
• A systematic literature review on hardware reliability assessment methods for deep neural networksAhmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, MaksimACM Computing Surveys2024 / art. 141, 39 p. : ill https://doi.org/10.1145/3638242 https://www.scopus.com/sourceid/23038 https://www.scopus.com/record/display.uri?eid=2-s2.0-85188964919&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1145%2F3638242%29&relpos=0 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=ACM%20COMPUT%20SURV&year=2023 https://www.webofscience.com/wos/woscc/full-record/WOS:001208566200007
• Use of formal methods for verification and optimization of fault lists in the scope of ISO26262Augusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2018 Design and Verification Conference (DVCON) Europe : [proceedings]2018 / 6 p. : ill https://repository.tudelft.nl/islandora/object/uuid%3Adbd7f22d-0324-45f5-9180-8fe3fc95a9ce