• Automated identification of application-dependent safe faults in automotive systems-on-a-chipsBagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sonza Reorda, Matteo; Hamdioui, Said; Jenihhin, Maksim; Sauer, ChristianElectronics2022 / art. 319 https://doi.org/10.3390/electronics11030319 https://www.scopus.com/sourceid/21100829272 https://www.scopus.com/record/display.uri?eid=2-s2.0-85122936454&origin=inward&txGid=5d6e8d72b1ef5e0219cb0f5191808c5d https://jcr.clarivate.com/jcr-jp/journal-profile?journal=ELECTRONICS-SWITZ&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000759878100001
• Combining fault analysis technologies for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings2019 / p. 129–134 : ill https://doi.org/10.1109/ATS47505.2019.00024
• Determined-safe faults identification : a step towards ISO26262 hardware compliant designsAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Sonza Reorda, Matteo; Hamdioui, Said; Sauer, Christian2020 25th IEEE European Test Symposium (ETS)2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131568
• A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMsCardoso Medeiros, Guilherme; Gürsoy, Cemil Cem; Fieback, Moritz; Wu, Lizhou; Jenihhin, Maksim; Taouil, Mottaqiallah; Hamdioui, Said2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings2020 / p. 792-797 https://doi.org/10.23919/DATE48585.2020.9116278
• Efficient methodology for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Rhodes, Greece2019 / p. 255-256 https://doi.org/10.1109/IOLTS.2019.8854449
• IEEE European Test Symposium (ETS)Eggersgluss, Stephan; Hamdioui, Said; Jutman, Artur; Michael, Maria K.; Raik, Jaan2019 IEEE International Test Conference (ITC)2019 / 4 p https://doi.org/10.1109/ITC44170.2019.9000148 https://www.scopus.com/sourceid/25589 https://www.scopus.com/record/display.uri?eid=2-s2.0-85081583727&origin=inward&txGid=3cc96819b9a7387458a3ba31812d2556 https://www.webofscience.com/wos/woscc/full-record/WOS:000540385000037
• LiD-CAT: A lightweight detector for cache ATtacksReinbrecht, Cezar; Hamdioui, Said; Taouil, Mottaqiallah; Niazmand, Behrad; Ghasempouri, Tara; Raik, Jaan; Sepulveda, Johanna2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25-29, 2020 Tallinn, Estonia : proceedings2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131603
• Memristive device based circuits for computation-in-memory architecturesLebdeh, Muath Abu; Reinsalu, Uljana; Nguyen, Hoang Anh Du; Wong, Stephan; Hamdioui, Said2019 IEEE International Symposium on Circuits and Systems (ISCAS) : proceedings2019 / 5 p. : ill https://doi.org/10.1109/ISCAS.2019.8702542 https://www.scopus.com/sourceid/56190 https://www.scopus.com/record/display.uri?eid=2-s2.0-85066016527&origin=inward&txGid=399fe89b18ea05b8a1fc6f67b5369fd3 https://www.webofscience.com/wos/woscc/full-record/WOS:000483076402010
• Modeling soft-error reliability under variabilityBalakrishnan, Aneesh; Cardoso Medeiros, Guilherme; Gürsoy, Cemil Cem; Hamdioui, Said; Jenihhin, Maksim; Alexandrescu, Dan2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 6-8 Oct. 20212021 / p. 1-6 https://doi.org/10.1109/DFT52944.2021.9568295
• On BTI aging rejuvenation in memory address decodersGürsoy, Cemil Cem; Kraak, Daniel; Ahmed, Foisal; Taouil, Mottaqiallah; Jenihhin, Maksim; Hamdioui, Said2022 IEEE 23rd Latin American Test Symposium, LATS 20222022 / Code 184360 https://doi.org/10.1109/LATS57337.2022.9936940
• A security verification template to assess cache architecture vulnerabilitiesGhasempouri, Tara; Raik, Jaan; Paul, Kolin; Reinbrecht, Cezar; Hamdioui, Said; Taouil, M.2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), April 22nd – 24th 2020 Novi Sad, Serbia : Proceedings2020 / art. 9095707, 6 p https://doi.org/10.1109/DDECS50862.2020.9095707
• Survey on architectural attacks : a unified classification and attack modelGhasempouri, Tara; Raik, Jaan; Reinbrecht, Cezar; Hamdioui, Said; Hamdioui, SaidACM Computing Surveys2023 / art. 42 https://doi.org/10.1145/3604803 https://www.scopus.com/sourceid/23038 https://www.scopus.com/record/display.uri?eid=2-s2.0-85174677921&origin=resultslist&sort=plf-f&src=s&sid=5017a1c9d633ac6f0480b4ae72b5920a&sot=b&sdt=b&s=TITLE-ABS-KEY%28%22Survey+on+Architectural+Attacks%3A+A+Unified+Classification+and+Attack+Model%22%29&sl=91&sessionSearchId=5017a1c9d633ac6f0480b4ae72b5920a&relpos=0 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=ACM%20COMPUT%20SURV&year=2023 https://www.webofscience.com/wos/woscc/full-record/WOS:001085637600017
• Use of formal methods for verification and optimization of fault lists in the scope of ISO26262Augusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2018 Design and Verification Conference (DVCON) Europe : [proceedings]2018 / 6 p. : ill https://repository.tudelft.nl/islandora/object/uuid%3Adbd7f22d-0324-45f5-9180-8fe3fc95a9ce
• Using STLs for effective in-field test of GPUsRodriguez Condia, Josie E.; Da Silva, Felipe Augusto; Bagbaba, Ahmet Cagrl; Guerrero-Balaguera, Juan-David; Hamdioui, Said; Sauer, Christian; Reorda, Matteo SonzaIEEE Design and Test2023 / p. 109-117 https://doi.org/10.1109/MDAT.2022.3188573 https://www.scopus.com/sourceid/21100286806 https://www.scopus.com/record/display.uri?eid=2-s2.0-85134217319&origin=inward&txGid=5c55e6f09f3a758ff423ba6cdbf70264 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20DES%20TEST&year=2023 https://www.webofscience.com/wos/woscc/full-record/WOS:001060451700010
• Verifying cache architecture vulnerabilities using a formal security verification flowGhasempouri, Tara; Raik, Jaan; Paul, Kolin; Reinbrecht, Cezar; Hamdioui, Said; Taouil, MottaqiallahMicroelectronics reliability2021 / art. 114085 https://doi.org/10.1016/j.microrel.2021.114085 https://www.scopus.com/sourceid/26717 https://www.scopus.com/record/display.uri?eid=2-s2.0-85102872009&origin=inward&txGid=bbbec1675d4df7951ad6c8a70f214a97 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROELECTRON%20RELIAB&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000637756900007