• Explorations in low area overhead DfT techniques for sequential BISTRaik, Jaan; Raidma, Rein; Ubar, Raimund-JohannesIEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings2003 / p. 220-223 : ill
• Fast test cost calculation for hybrid BIST in digital systemsOrasson, Elmet; Raidma, Rein; Ubar, Raimund-Johannes; Jervan, Gert; Peng, ZeboEuromicro Symposium on Digital Systems Design : [Architectures, Methods and Tools : DSD 2001] : September 4-6, 2001, Warsaw, Poland : proceedings2001 / p. 318-325 : ill https://www.semanticscholar.org/paper/Fast-test-cost-calculation-for-hybrid-BIST-in-Orasson-Raidma/5aafcda5a18c2aabf0ad20cac10af10727f3c58f
• NASA võretöötlusarhitektuurRaidma, ReinA & A2002 / 3, lk. 7-13 https://artiklid.elnet.ee/record=b1009960*est