• Automated identification of application-dependent safe faults in automotive systems-on-a-chipsBagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sonza Reorda, Matteo; Hamdioui, Said; Jenihhin, Maksim; Sauer, ChristianElectronics2022 / art. 319 https://doi.org/10.3390/electronics11030319 https://www.scopus.com/sourceid/21100829272 https://www.scopus.com/record/display.uri?eid=2-s2.0-85122936454&origin=inward&txGid=5d6e8d72b1ef5e0219cb0f5191808c5d https://jcr.clarivate.com/jcr-jp/journal-profile?journal=ELECTRONICS-SWITZ&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000759878100001
• Special session : AutoSoC - a suite of open-source automotive SoC benchmarksSilva, Felipe Augusto da; Bagbaba, Ahmet Cagri; Ruospo, Annachiara; Jenihhin, Maksim2020 IEEE 38th VLSI TEST SYMPOSIUM (VTS) - VTS 2020 : proceedings2020 / 9 p. : ill https://doi.org/10.1109/VTS48691.2020.9107599 https://www.scopus.com/sourceid/14939 https://www.scopus.com/record/display.uri?eid=2-s2.0-85086505407&origin=inward&txGid=bed9952d8e62b54a39971e249e5e1ba3 https://www.webofscience.com/wos/woscc/full-record/WOS:000590395200020