• AdAM: Adaptive Approximate Multiplier for Fault Tolerance in DNN AcceleratorsTaheri, Mahdi; Cherezova, Natalia; Nazari, Samira; Azarpeyvand, Ali; Ghasempouri, Tara; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, MaksimIEEE transactions on device and materials reliability2024 / p. 66-75 : ill https://doi.org//10.1109/TDMR.2024.3523386
• AdAM: adaptive fault-tolerant approximate multiplier for edge DNN acceleratorsTaheri, Mahdi; Cherezova, Natalia; Nazari, Samira; Rafiq, Ahsan; Azarpeyvand, Ali; Ghasempouri, Tara; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim2024 IEEE European Test Symposium (ETS): ETS 2024 : May 20-24, 2024, The Hague, Netherlands : proceedings2024 https://doi.org/10.1109/ETS61313.2024.10567161 https://www.scopus.com/sourceid/21100395950 https://www.scopus.com/record/display.uri?eid=2-s2.0-85197518684&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1109%2FETS61313.2024.10567161%29&sessionSearchId=2694adcfded71cf12565f4df31de58f5&relpos=0 https://www.webofscience.com/wos/woscc/full-record/WOS:001260970400008
• Digital Twin : industrial robot kinematic model integration to the virtual reality environmentKuts, Vladimir; Cherezova, Natalia; Sarkans, Martinš; Otto, TaunoJournal of machine engineering2020 / p. 53–64 https://doi.org/10.36897/jme/120182 https://www.scopus.com/sourceid/21100781705 https://www.scopus.com/record/display.uri?eid=2-s2.0-85087168874&origin=inward&txGid=79c5d1f387700f10d15967eeddfd29d5
• Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN AcceleratorsTaheri, Mahdi; Cherezova, Natalia; Ansari, Mohammad Saeed; Jenihhin, Maksim; Mahani, Ali; Daneshtalab, Masoud; Raik, Jaan25th International Symposium on Quality Electronic Design (ISQED)2025 / 8 p. : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=10528372
• Heterogeneous Approximation of DNN HW Accelerators based on Channels VulnerabilityCherezova, Natalia; Pappalardo, Salvatore; Taheri, Mahdi; Ahmadilivani, Mohammad Hasan; Deveautour, Bastien; Bosio, Alberto; Raik, Jaan; Jenihhin, Maksim2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC)2024 / 4 p. : ill https://doi.org//10.1109/VLSI-SoC62099.2024.10767798
• HLS-based optimization of tau triggering algorithm for LHC: a case studyCherezova, Natalia; Mihhailov, Dmitri; Devadze, Sergei; Jutman, Artur2022 18th Biennial Baltic Electronics Conference (BEC)2022 / 6 p. : ill https://doi.org/10.1109/BEC56180.2022.9935599
• Keynote: cost-efficient reliability for Edge-AI chipsJenihhin, Maksim; Taheri, Mahdi; Cherezova, Natalia; Ahmadilivani, Mohammad Hasan; Selg, Hardi; Jutman, Artur; Shibin, Konstantin; Tsertov, Anton; Devadze, Sergei; Kodamanchili, Rama Mounika; Rafiq, Ahsan; Raik, Jaan; Daneshtalab, Masoud2024 IEEE 25th Latin American Test Symposium (LATS)2024 / 2 p https://doi.org/10.1109/LATS62223.2024.10534610 https://www.scopus.com/record/display.uri?eid=2-s2.0-85195425788&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1109%2FLATS62223.2024.10534610%29&sessionSearchId=03854897c8e6e7bbc8ffad5b01ef8afb&relpos=0
• Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applicationsCherezova, Natalia; Shibin, Konstantin; Jenihhin, Maksim; Jutman, ArturMicroelectronics reliability2023 / art. 115010, 10 p. : ill https://doi.org/10.1016/j.microrel.2023.115010 https://www.scopus.com/sourceid/26717 https://www.scopus.com/record/display.uri?eid=2-s2.0-85159638800&origin=inward&txGid=5c8c991b1cc2020860e81a21c25c1f79 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROELECTRON%20RELIAB&year=2023 https://www.webofscience.com/wos/woscc/full-record/WOS:001001810500001