Wafer-level die re-test success prediction using machine learning
Selg, Hardi
;
Jenihhin, Maksim
;
Ellervee, Peeter
21st IEEE Latin-American Test Symposium (LATS) 2020 : proceedings
2020
/
5 p
https://doi.org/10.1109/LATS49555.2020.9093672