Reliability evaluation of isolated buck-boost DC-DC series resonant converter
Bakeer, Abualkasim Ahmed Ali
;
Chub, Andrii
;
Shen, Yanfeng
IEEE open journal of power electronics
2022
/
p. 131-141
https://doi.org/10.1109/OJPEL.2022.3157200
https://www.scopus.com/sourceid/21101094830
https://www.scopus.com/record/display.uri?eid=2-s2.0-85133396840&origin=inward&txGid=98513ad0cedd809ea7333d1a238cb6b3
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20OPEN%20J%20POWER%20EL&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000772402000001