• Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN AcceleratorsTaheri, Mahdi; Cherezova, Natalia; Ansari, Mohammad Saeed; Jenihhin, Maksim; Mahani, Ali; Daneshtalab, Masoud; Raik, Jaan25th International Symposium on Quality Electronic Design (ISQED)2025 / 8 p. : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=10528372
• A fault-resistant architecture for AES S-box architectureTaheri, Mahdi; Sheikhpour, Saeideh; Ansari, Mohammad Saeed; Mahani, AliJournal of Applied Research in Electrical Engineering2021 / p. 86-92 https://doi.org/10.22055/jaree.2021.36230.1020
• A high-performance MEMRISTOR-based Smith-Waterman DNA sequence alignment using FPNI structureTaheri, Mahdi; Zandevakili, Hamed; Mahani, AliJournal of Applied Research in Electrical Engineering2021 / p. 59-68 https://doi.org/10.22055/jaree.2021.36117.1016
• A novel fault-tolerant logic style with self-checking capabilityTaheri, Mahdi; Sheikhpour, Saeideh; Mahani, Ali; Jenihhin, MaksimProceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 20222022 / art. 183305 : ill https://doi.org/10.1109/IOLTS56730.2022.9897818