Verifying cache architecture vulnerabilities using a formal security verification flow
Ghasempouri, Tara
;
Raik, Jaan
;
Paul, Kolin
;
Reinbrecht, Cezar
;
Hamdioui, Said
;
Taouil, Mottaqiallah
Microelectronics reliability
2021
/
art. 114085
https://doi.org/10.1016/j.microrel.2021.114085
https://www.scopus.com/sourceid/26717
https://www.scopus.com/record/display.uri?eid=2-s2.0-85102872009&origin=inward&txGid=bbbec1675d4df7951ad6c8a70f214a97
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROELECTRON%20RELIAB&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000637756900007