• AdAM: Adaptive Approximate Multiplier for Fault Tolerance in DNN AcceleratorsTaheri, Mahdi; Cherezova, Natalia; Nazari, Samira; Azarpeyvand, Ali; Ghasempouri, Tara; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, MaksimIEEE transactions on device and materials reliability2024 / p. 66-75 : ill https://doi.org//10.1109/TDMR.2024.3523386
• AdAM: adaptive fault-tolerant approximate multiplier for edge DNN acceleratorsTaheri, Mahdi; Cherezova, Natalia; Nazari, Samira; Rafiq, Ahsan; Azarpeyvand, Ali; Ghasempouri, Tara; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim2024 IEEE European Test Symposium (ETS): ETS 2024 : May 20-24, 2024, The Hague, Netherlands : proceedings2024 https://doi.org/10.1109/ETS61313.2024.10567161 https://www.scopus.com/sourceid/21100395950 https://www.scopus.com/record/display.uri?eid=2-s2.0-85197518684&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1109%2FETS61313.2024.10567161%29&sessionSearchId=2694adcfded71cf12565f4df31de58f5&relpos=0 https://www.webofscience.com/wos/woscc/full-record/WOS:001260970400008
• APPRAISER : DNN fault resilience analysis employing approximation errorsTaheri, Mahdi; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)2023 / p. 124−127 : ill https://ddecs2023.taltech.ee/ https://doi.org//10.1109/DDECS57882.2023.10139468
• Area efficient hexadecimal divider circuit implementation based on USP-awadhoot division algorithmPatankar, Udayan Sunil; Koel, Ants; Patankar, Sunil M.; Flores, Miguel E.IEEE International Conference on Engineering, Technology and Innovation (ICE/ITMC)2021 / p. 1-8 https://doi.org/10.1109/ICE/ITMC52061.2021.9570263
• Complex division by Baudhayan triplet algorithm using novel state of the art USP-awadhoot dividerPatankar, Udayan Sunil; Koel, Ants; Patankar, Sunil M.; Flores, Miguel E.IEEE 4th Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC)2021 / p. 1918-1922 https://doi.org/10.1109/IMCEC51613.2021.9482010
• DeepAxe : a framework for exploration of approximation and reliability trade-offs in DNN acceleratorsTaheri, Mahdi; Riazati, Mohamad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjödin, Mikael; Lisper, Björn2023 24th International Symposium on Quality Electronic Design (ISQED)2023 / 8 p. : ill https://doi.org/10.1109/ISQED57927.2023.10129353
• Divider implementation based on USP-awadhoot division algorithm For area optimizationPatankar, Udayan Sunil; Koel, Ants; Patankar, Sunil M.; Flores, Miguel E.IEEE 4th Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC)2021 / p. 1675-1682 https://doi.org/10.1109/IMCEC51613.2021.9482132
• Heterogeneous Approximation of DNN HW Accelerators based on Channels VulnerabilityCherezova, Natalia; Pappalardo, Salvatore; Taheri, Mahdi; Ahmadilivani, Mohammad Hasan; Deveautour, Bastien; Bosio, Alberto; Raik, Jaan; Jenihhin, Maksim2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC)2024 / 4 p. : ill https://doi.org//10.1109/VLSI-SoC62099.2024.10767798
• Special session : approximation and fault resiliency of DNN acceleratorsAhmadilivani, Mohammad Hasan; Barbareschi, Mario; Barone, Salvatore; Bosio, Alberto; Daneshtalab, Masoud; Torca, Salvatore Della; Gavarini, Gabriele; Jenihhin, Maksim; Raik, Jaan; Taheri, Mahdi2023 IEEE 41st VLSI Test Symposium (VTS) : proceedings2023 / 10 p. : ill https://doi.org/10.1109/VTS56346.2023.10140043 https://www.scopus.com/sourceid/14939 https://www.scopus.com/record/display.uri?eid=2-s2.0-85161889760&origin=inward&txGid=7246f38058a8b9b32768d1928b8eec68 https://www.webofscience.com/wos/woscc/full-record/WOS:001011806600022
• Special session: reliability assessment recipes for DNN acceleratorsAhmadilivani, Mohammad Hasan; Bosio, Alberto; Deveautour, Bastien; Dos Santos, Fernando Fernandes; Guerrero-Balaguera, Juan-David; Jenihhin, Maksim; Kritikakou, Angeliki; Sierra, Robert Limas; Raik, Jaan; Taheri, Mahdi42nd IEEE VLSI Test Symposium, VTS 20242024 / 11 p. : ill https://doi.org/10.1109/VTS60656.2024.10538707 https://www.scopus.com/sourceid/14939 https://www.scopus.com/record/display.uri?eid=2-s2.0-85195242212&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=TITLE-ABS-KEY%28%22Special+Session%3A+Reliability+Assessment+Recipes+for+DNN+Accelerators%22%29&sessionSearchId=f53bb18a788748acab088b0e35200e2d&relpos=0 https://www.webofscience.com/wos/woscc/full-record/WOS:001239933000019
• Study of estimation based functional iteration approximation dividersPatankar, Udayan Sunil; Flores, Miguel E.; Koel, AntsICCE-2021 IEEE International Conference on Consumer Electronics, CES2021 / p. 1-4 https://doi.org/10.1109/ICCE50685.2021.9427657 https://www.scopus.com/sourceid/26010 https://www.scopus.com/record/display.uri?eid=2-s2.0-85105994006&origin=inward&txGid=fabe73d51a07f91a2b798c6927b7c005 https://www.webofscience.com/wos/woscc/full-record/WOS:000675600200075