Automated identification of application-dependent safe faults in automotive systems-on-a-chips
Bagbaba, Ahmet Cagri
;
Augusto da Silva, Felipe
;
Sonza Reorda, Matteo
;
Hamdioui, Said
;
Jenihhin, Maksim
;
Sauer, Christian
Electronics
2022
/
art. 319
https://doi.org/10.3390/electronics11030319
https://www.scopus.com/sourceid/21100829272
https://www.scopus.com/record/display.uri?eid=2-s2.0-85122936454&origin=inward&txGid=5d6e8d72b1ef5e0219cb0f5191808c5d
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=ELECTRONICS-SWITZ&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000759878100001