Side-channel attacks on triple modular redundancy schemes
Almeida, Felipe
;
Aksoy, Levent
;
Raik, Jaan
;
Pagliarini, Samuel Nascimento
2021 IEEE 30th Asian Test Symposium ATS 2021 : proceedings
2021
/
p. 79-84 : ill
https://doi.org/10.1109/ATS52891.2021.00026
https://www.scopus.com/sourceid/14494
https://www.scopus.com/record/display.uri?eid=2-s2.0-85124706879&origin=inward&txGid=d523894835aa1e27e51a5c4020036746
https://www.webofscience.com/wos/woscc/full-record/WOS:000781836500014