• Holistic IJTAG-based external and internal fault monitoring in UAVsAhmed, Foisal; Jenihhin, MaksimarXiv.org2023 / 6 p. : ill https://doi.org/10.48550/arXiv.2303.01816
• On BTI aging rejuvenation in memory address decodersGürsoy, Cemil Cem; Kraak, Daniel; Ahmed, Foisal; Taouil, Mottaqiallah; Jenihhin, Maksim; Hamdioui, Said2022 IEEE 23rd Latin American Test Symposium, LATS 20222022 / Code 184360 https://doi.org/10.1109/LATS57337.2022.9936940
• Reliability-critical computation offloading in UAV swarmsRahbari, Dadmehr; Ahmed, Foisal; Jenihhin, Maksim; Alam, Muhammad Mahtab; Le Moullec, YannickIEEE Systems Journal2024 / p. 1871-1882 https://doi.org/10.1109/JSYST.2024.3432449
• A survey on UAV computing platforms : a hardware reliability perspectiveAhmed, Foisal; Jenihhin, MaksimSensors2022 / art. 6286 https://doi.org/10.3390/s22166286 https://www.scopus.com/sourceid/130124 https://www.scopus.com/record/display.uri?eid=2-s2.0-85136625318&origin=inward&txGid=104823fe2944deb91b3cd11de67100a3 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=SENSORS-BASEL&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000845429300001
• Systematic unsupervised recycled field-programmable gate array detectionIsaka, Yuya; Shintani, Michihiro; Ahmed, Foisal; Inoue, MichikoIEEE transactions on device and materials reliability2022 / 10 p. : ill https://doi.org/10.1109/TDMR.2022.3164788 https://www.scopus.com/sourceid/26049 https://www.scopus.com/record/display.uri?eid=2-s2.0-85127747038&origin=inward&txGid=3198fc47a697d91dd3b9d6fe2fbe8c2f https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20T%20DEVICE%20MAT%20RE&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000808073600012
• Unsupervised recycled FPGA detection using symmetry analysisTarique, Tanvir Ahmad; Ahmed, Foisal; Jenihhin, Maksim; Ali, Liakot12th International Conference on Electrical and Computer Engineering : ICECE 20222022 / p. 437-440 https://doi.org/10.1109/ICECE57408.2022.10088856