• AdAM: adaptive fault-tolerant approximate multiplier for edge DNN acceleratorsTaheri, Mahdi; Cherezova, Natalia; Nazari, Samira; Rafiq, Ahsan; Azarpeyvand, Ali; Ghasempouri, Tara; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim2024 IEEE European Test Symposium (ETS): ETS 2024 : May 20-24, 2024, The Hague, Netherlands : proceedings2024 https://doi.org/10.1109/ETS61313.2024.10567161 https://www.scopus.com/sourceid/21100395950 https://www.scopus.com/record/display.uri?eid=2-s2.0-85197518684&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1109%2FETS61313.2024.10567161%29&sessionSearchId=2694adcfded71cf12565f4df31de58f5&relpos=0 https://www.webofscience.com/wos/woscc/full-record/WOS:001260970400008
• DeepAxe : a framework for exploration of approximation and reliability trade-offs in DNN acceleratorsTaheri, Mahdi; Riazati, Mohamad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjödin, Mikael; Lisper, Björn2023 24th International Symposium on Quality Electronic Design (ISQED)2023 / 8 p. : ill https://doi.org/10.1109/ISQED57927.2023.10129353
• Special session : approximation and fault resiliency of DNN acceleratorsAhmadilivani, Mohammad Hasan; Barbareschi, Mario; Barone, Salvatore; Bosio, Alberto; Daneshtalab, Masoud; Torca, Salvatore Della; Gavarini, Gabriele; Jenihhin, Maksim; Raik, Jaan; Taheri, Mahdi2023 IEEE 41st VLSI Test Symposium (VTS) : proceedings2023 / 10 p. : ill https://doi.org/10.1109/VTS56346.2023.10140043 https://www.scopus.com/sourceid/14939 https://www.scopus.com/record/display.uri?eid=2-s2.0-85161889760&origin=inward&txGid=7246f38058a8b9b32768d1928b8eec68 https://www.webofscience.com/wos/woscc/full-record/WOS:001011806600022
• Special session: reliability assessment recipes for DNN acceleratorsAhmadilivani, Mohammad Hasan; Bosio, Alberto; Deveautour, Bastien; Dos Santos, Fernando Fernandes; Guerrero-Balaguera, Juan-David; Jenihhin, Maksim; Kritikakou, Angeliki; Sierra, Robert Limas; Raik, Jaan; Taheri, Mahdi42nd IEEE VLSI Test Symposium, VTS 20242024 / 11 p. : ill https://doi.org/10.1109/VTS60656.2024.10538707 https://www.scopus.com/sourceid/14939 https://www.scopus.com/record/display.uri?eid=2-s2.0-85195242212&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=TITLE-ABS-KEY%28%22Special+Session%3A+Reliability+Assessment+Recipes+for+DNN+Accelerators%22%29&sessionSearchId=f53bb18a788748acab088b0e35200e2d&relpos=0 https://www.webofscience.com/wos/woscc/full-record/WOS:001239933000019