• Effects of environmental conditions on the performance of thermal imagersVendt, Riho; Juurma, Madis; Vabson, Viktor; Jaanson, Priit; Kübarsepp, Toomas; Noorma, MartInternational journal of thermophysics2011 / 1/2, p. 248-257 : ill https://link.springer.com/article/10.1007/s10765-010-0896-4
• Feature article: Firmware updating systems for nanosatellitesSünter, Indrek; Slavinskis, Andris; Kvell, Urmas; Vahter, Andres; Kuuste, Henri; Noorma, Mart; Kutt, Johan; Vendt, Riho; Tarbe, Karl; Pajusalu, Mihkel; Veske, Mihkel; Ilves, TaaviIEEE Aerospace and Electronic Systems Magazine2016 / p. 36 - 44 https://doi.org/10.1109/MAES.2016.150162 https://www.scopus.com/sourceid/25993 https://www.scopus.com/record/display.uri?eid=2-s2.0-84976884548&origin=resultslist&sort=plf-f&src=s&sid=ec6ceae7563257d48689ec2672e7747a&sot=b&sdt=b&s=DOI%2810.1109%2FMAES.2016.150162%29&sl=29&sessionSearchId=ec6ceae7563257d48689ec2672e7747a&relpos=0 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20AERO%20EL%20SYS%20MAG&year=2016 https://www.webofscience.com/wos/woscc/full-record/WOS:000379701600005
• Method for obtaining linear spectral responsivity of InGaAs-photodetector in the NIR wavelength rangePokatilov, Andrei; Parker, Martin; Kübarsepp, Toomas; Vabson, Viktor; Vendt, Riho; Ansko, Ilmar; Manoocheri, FarshidBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 31-34 : ill http://www.ester.ee/record=b2150914*est
• Traceability of temperature measurements in EstoniaVendt, Riho; Vabson, Viktor; Kübarsepp, Toomas; Noorma, MartProceedings of the Estonian Academy of Sciences2013 / p. 116-121 : ill