EFIC-ME : a fast emulation based fault injection control and monitoring enhancement
Abideen, Zain Ul
;
Rashid, Muhammad Haroon
IEEE Access
2020
/
p. 207705-207716
https://doi.org/10.1109/ACCESS.2020.3038198
https://www.scopus.com/sourceid/21100374601
https://www.scopus.com/record/display.uri?eid=2-s2.0-85097356103&origin=inward&txGid=2f1165cb9a49c99935e3d326b2af989d
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20ACCESS&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000595015400001