• A novel random approach to diagnostic test generationOsimiry, Emmanuel Ovie; Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark2016 / [4] p. : ill https://doi.org/10.1109/NORCHIP.2016.7792915