IEEE European Test Symposium (ETS)
Eggersgluss, Stephan
;
Hamdioui, Said
;
Jutman, Artur
;
Michael, Maria K.
;
Raik, Jaan
2019 IEEE International Test Conference (ITC)
2019
/
4 p
https://doi.org/10.1109/ITC44170.2019.9000148
https://www.scopus.com/sourceid/25589
https://www.scopus.com/record/display.uri?eid=2-s2.0-85081583727&origin=inward&txGid=3cc96819b9a7387458a3ba31812d2556
https://www.webofscience.com/wos/woscc/full-record/WOS:000540385000037