Understanding multidimensional verification : where functional meets non-functional
Lai, Xinhui
;
Balakrishnan, Aneesh
;
Lange, Thomas
;
Jenihhin, Maksim
;
Ghasempouri, Tara
;
Raik, Jaan
;
Alexandrescu, Dan
Microprocessors and microsystems
2019
/
art. 102867, 13 p. : ill
https://doi.org/10.1016/j.micpro.2019.102867
https://www.scopus.com/sourceid/15552
https://www.scopus.com/record/display.uri?eid=2-s2.0-85071020969&origin=inward&txGid=87d2f90199a10d44d941b14d594d2f30
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROPROCESS%20MICROSY&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000500052000047