Evaluating architectural, redundancy, and implementation strategies for radiation hardening of FinFET integrated circuits
Pagliarini, Samuel Nascimento
;
Benites, Luis
;
Martins, Mayler
;
Rech, Paolo
;
Kastensmidt, Fernanda
IEEE transactions on nuclear science
2021
/
p. 1045-1053
https://doi.org/10.1109/TNS.2021.3070643
https://www.scopus.com/sourceid/17368
https://www.scopus.com/record/display.uri?eid=2-s2.0-85103797089&origin=inward&txGid=6c92c2fbb6cf4232257945f91e1079ba
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20T%20NUCL%20SCI&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000655537500073