Systematic unsupervised recycled field-programmable gate array detection
Isaka, Yuya
;
Shintani, Michihiro
;
Ahmed, Foisal
;
Inoue, Michiko
IEEE transactions on device and materials reliability
2022
/
10 p. : ill
https://doi.org/10.1109/TDMR.2022.3164788
https://www.scopus.com/sourceid/26049
https://www.scopus.com/record/display.uri?eid=2-s2.0-85127747038&origin=inward&txGid=3198fc47a697d91dd3b9d6fe2fbe8c2f
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20T%20DEVICE%20MAT%20RE&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000808073600012