• Compensation of the baseline temperature fluctuations for autonomous CE–C4D instrument working in harsh environmentsDrevinskas, Tomas; Telksnys, Laimutis; Maruška, Audrius; Gorbatšova, Jelena; Kaljurand, MihkelElectrophoresis2018 / p. 2877–2883 : ill https://doi.org/10.1002/elps.201800132 https://www.scopus.com/sourceid/23524 https://www.scopus.com/record/display.uri?eid=2-s2.0-85048143947&origin=inward&txGid=f0586fb9f4f683de4be80f5d7e6f1743 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=ELECTROPHORESIS&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000450406900007