• Keynote: cost-efficient reliability for Edge-AI chipsJenihhin, Maksim; Taheri, Mahdi; Cherezova, Natalia; Ahmadilivani, Mohammad Hasan; Selg, Hardi; Jutman, Artur; Shibin, Konstantin; Tsertov, Anton; Devadze, Sergei; Kodamanchili, Rama Mounika; Rafiq, Ahsan; Raik, Jaan; Daneshtalab, Masoud2024 IEEE 25th Latin American Test Symposium (LATS)2024 / 2 p https://doi.org/10.1109/LATS62223.2024.10534610 https://www.scopus.com/record/display.uri?eid=2-s2.0-85195425788&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1109%2FLATS62223.2024.10534610%29&sessionSearchId=03854897c8e6e7bbc8ffad5b01ef8afb&relpos=0
• On-chip sensors data collection and analysis for SoC health managementShibin, Konstantin; Jenihhin, Maksim; Jutman, Artur; Devadze, Sergei; Tsertov, Anton2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2023 / 6 p https://doi.org/10.1109/DFT59622.2023.10313562
• Special session: in-field ML-assisted intermittent fault localization and management in RISC-V SoCsSelg, Hardi; Shibin, Konstantin; Tsertov, Anton; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2024 https://doi.org/10.1109/DFT63277.2024.10753541 https://www.scopus.com/record/display.uri?eid=2-s2.0-85212426533&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1109%2FDFT63277.2024.10753541%29&sessionSearchId=f890857a41c36254c0f644edbb3c2ac3&relpos=0