Using STLs for effective in-field test of GPUs
Rodriguez Condia, Josie E.
;
Da Silva, Felipe Augusto
;
Bagbaba, Ahmet Cagrl
;
Guerrero-Balaguera, Juan-David
;
Hamdioui, Said
;
Sauer, Christian
;
Reorda, Matteo Sonza
IEEE Design and Test
2023
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p. 109-117
https://doi.org/10.1109/MDAT.2022.3188573
https://www.scopus.com/sourceid/21100286806
https://www.scopus.com/record/display.uri?eid=2-s2.0-85134217319&origin=inward&txGid=5c55e6f09f3a758ff423ba6cdbf70264
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20DES%20TEST&year=2023
https://www.webofscience.com/wos/woscc/full-record/WOS:001060451700010