Rejuvenation of NBTI-impacted processors using evolutionary generation of assembler programs
Pellerey, Francesco
;
Jenihhin, Maksim
;
Squillero, Giovanni
;
Raik, Jaan
;
Sonza Reorda, Matteo
;
Tihhomirov, Valentin
;
Ubar, Raimund-Johannes
2016 IEEE 25th Asian Test Symposium : 21-24 November 2016, Hiroshima, Japan
2016
/
p. 304-309 : ill
https://doi.org/10.1109/ATS.2016.57
https://www.scopus.com/sourceid/14494
https://www.scopus.com/record/display.uri?eid=2-s2.0-85010190419&origin=inward&txGid=94278d8f3fdc4662a5660d06c967d131
https://www.webofscience.com/wos/woscc/full-record/WOS:000391554900058