• Assessment of diagnostic test for automated bug localizationTihhomirov, Valentin; Tšepurov, Anton; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesLATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]2013 / [6] p. : ill
• Automated design error debug using high-level decision diagrams and mutation operatorsRaik, Jaan; Repinski, Urmas; Tšepurov, Anton; Hantson, Hanno; Ubar, Raimund-Johannes; Jenihhin, MaksimMicroprocessors and microsystems2013 / p. 505-513 : ill https://doi.org/10.1016/j.micpro.2012.11.004 https://www.scopus.com/sourceid/15552 https://www.scopus.com/record/display.uri?eid=2-s2.0-84878621727&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1016%2Fj.micpro.2012.11.004%29&sessionSearchId=81bea3cc7c86d66922f228affe5df51e https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROPROCESS%20MICROSY&year=2013 https://www.webofscience.com/wos/woscc/full-record/WOS:000324667900012
• Model-based verification with error localization and error correction for C designsRepinski, UrmasПрограммные продукты и системы = Programmnye produkty i sistemy = Software & systems2012 / p. 221-229 : ill
• PSL assertion checkers synthesis with ASM based HLS tool ABELITEJenihhin, Maksim; Baranov, Samary; Raik, Jaan; Tihhomirov, ValentinLATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador2012 / [6 p.] : ill https://ieeexplore.ieee.org/document/6261251