Marginal PCB assembly defect detection on DDR3/4 memory bus
Odintsov, Sergei
;
Jutman, Artur
;
Devadze, Sergei
2017 IEEE International Test Conference (ITC 2017) : Forth Worth, Texas, USA, 31 October - 2 November 2017
2017
/
p. 238-247 : ill
https://doi.org/10.1109/TEST.2017.8242070
https://www.scopus.com/sourceid/25589
https://www.scopus.com/record/display.uri?eid=2-s2.0-85038601577&origin=inward&txGid=69af237766f73a4c6e2ae7c6c9a1d423
https://www.webofscience.com/wos/woscc/full-record/WOS:000426969200041