Special session: in-field ML-assisted intermittent fault localization and management in RISC-V SoCs
Selg, Hardi
;
Shibin, Konstantin
;
Tsertov, Anton
;
Jenihhin, Maksim
;
Ellervee, Peeter
;
Raik, Jaan
2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
2024
https://doi.org/10.1109/DFT63277.2024.10753541
https://www.scopus.com/sourceid/21101123252
https://www.scopus.com/pages/publications/85212426533?inward
https://www.webofscience.com/wos/woscc/full-record/WOS:001448004400020