Effective scalable IEEE 1687 instrumentation network for fault management
Jutman, Artur
;
Shibin, Konstantin
;
Devadze, Sergei
IEEE design & test
2013
/
p. 26-35 : ill
https://doi.org/10.1109/MDAT.2013.2278535
https://www.scopus.com/sourceid/21100286806
https://www.scopus.com/record/display.uri?eid=2-s2.0-84900025438&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1109%2FMDAT.2013.2278535%29&sessionSearchId=47e771afcc769678348f9a5b62e06fdd&relpos=0
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20DES%20TEST&year=2013
https://www.webofscience.com/wos/woscc/full-record/WOS:000328974800004