Study of surface defects in 4H-SiC Schottky diodes using a scanning Kelvin probe
Mizsei, Janos
;
Korolkov, Oleg
;
Toompuu, Jana
;
Mikli, Valdek
;
Rang, Toomas
Silicon Carbide and Related Materials 2012 : selected peer reviewed papers from the 9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), September 2-6, 2012, St. Petersburg, Russian Federation
2013
/
p. 677-680 : ill
https://doi.org/10.4028/www.scientific.net/MSF.740-742.677
https://www.scopus.com/sourceid/28700
https://www.scopus.com/record/display.uri?eid=2-s2.0-84874057454&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.4028%2Fwww.scientific.net%2FMSF.740-742.677%29&sessionSearchId=7c6b672404e1b83bceae9002c7d84c88
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MATER%20SCI%20FORUM&year=2005
https://www.webofscience.com/wos/woscc/full-record/WOS:000319785500161