• A knowledge-based approach to the specification-based program testingTepandi, JaakComputers and artificial intelligence = Вычислительные машины и искуственный интеллект = Pocitace a umela inteligencia1988 / p. 39-48 https://www.ester.ee/record=b1482459*est
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• A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est
• A new testability calculation method to guide RTL test generationRaik, Jaan; Nõmmeots, Tanel; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2005 / p. 71-82 : ill https://doi.org/10.1007/s10836-005-5288-5
• A PC-based CAD system for training digital testUbar, Raimund-Johannes; Buldas, Ahto; Paomets, Priidu; Raik, Jaan; Tulit, ViljarThe Fifth EUROCHIP Workshop on VLSI Design Training, 17-18-19 October 1994, Dresden, Germany1994 / p. 152-157: ill
• A proposal for optimisation of low-powered FSM testingBrik, Marina; Fomina, Jelena; Ubar, Raimund-JohannesProceedings of IEEE East-West Design & Test Workshop (EWDTW'05) : Odessa, Ukraine, September 15-19, 20052005 / p. 15-20
• A scalable static test set compaction method for sequential circuitsAleksejev, Igor; Raik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesProceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico2008 / p. 87-92 : ill
• A study of the toxicity of the ozonation products of phenols and chlorophenols by daphnia magna testTrapido, Marina; Veressinina, Jelena23rd Estonian Chemistry Days : abstracts of scientific conference1997 / p. 152
• A synthesis-agnostic behavioral fault model for high gate-level fault coverageKarputkin, Anton; Raik, Jaan2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings2016 / p. 1124-1127 : ill https://ieeexplore.ieee.org/document/7459477/figures#figures
• A testing strategy for interacting finite state machinesYevtushenko, Nina; Petrenko, Alexandre; Trenkaev, VadimBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 137-140: ill
• About robustness of test patterns regarding multiple faultsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanLATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador2012 / p. 86-91 : ill https://www.infona.pl/resource/bwmeta1.element.ieee-art-000006261243
• Abrasivity study of materials used at abrasive testsKulu, Priit; Veinthal, Renno; Käerdi, Helmo; Tarbe, RihoTribology 2008 : proceedings of the 9th International Tribology Conference : University of Pretoria, South Africa, 2-4 April 20082008 / p. 3.4(1)-3.4(10)
• Adaptive Extended Kalman Filter position estimation based on Ultra-Wideband Active-Passive Ranging ProtocolLaadung, Taavi; Ulp, Sander; Fjodorov, Aleksei; Alam, Muhammad Mahtab; Le Moullec, YannickIEEE Access2023 / p. 92575-92588 https://doi.org/10.1109/ACCESS.2023.3308696 https://www.scopus.com/sourceid/21100374601 https://www.scopus.com/record/display.uri?eid=2-s2.0-85168710588&origin=inward&txGid=21db6797c4f4a94e6e2c798695dd5baf https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20ACCESS&year=2023 https://www.webofscience.com/wos/woscc/full-record/WOS:001060260800001
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• AG-model for design of testable controllersKasirova, LiliaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 303-306: ill
• Air change efficiency of room ventilation unitsMikola, Alo; Rehand, Juhan; Kurnitski, JarekE3S Web of Conferences : CLIMA 2019 Congress, Bucharest, Romania, May 26-29, 20192019 / art. 01017, 8 p https://doi.org/10.1051/e3sconf/201911101017 https://www.scopus.com/sourceid/21100795900 https://www.scopus.com/record/display.uri?eid=2-s2.0-85071889269&origin=inward&txGid=a89890e09bed359fd65739f4be3b17cd
• Algorithms of functional level testability analysis for digital circuitsUbar, Raimund-Johannes; Kuchcinski, KtzysztofPeriodica polytechnica. Electrical engineering1992 / 3/4, p. 295-308
• Alternative graphs as a mathematical tool and knowledge representation for diagnosis purposes in digital systemsUbar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 285-292: ill
• An approach for PSL assertion coverage analysis with high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Shchenova, TatjanaProceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 20102010 / p. 13-16 : ill https://ieeexplore.ieee.org/document/5742048
• An approach for verification assertions reuse in RTL test pattern generationJenihhin, Maksim; Raik, Jaan; Fujiwara, Hideo; Ubar, Raimund-Johannes; Viilukas, TaaviDigest of papers : IEEE 11th Workshop on RTL and High Level Testing : WRTLT'10 : December 5-6, 2010, Shanghai, China2010 / p. 107-110 : ill
• An approach to model development for embedded testingTimohovich, E.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 353-358
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• An automatic test generation system for microprocessor VLSIKont, ToomasМашинное проектирование электронных устройств и систем1989 / p. 104-113
• An educational environment for digital testing : hardware, tools, and web-based runtime platformJutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes; Vislogubov, VladislavProceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 412-419 : ill https://www.researchgate.net/profile/Artur-Jutman/publication/220880167_An_Educational_Environment_for_Digital_Testing_Hardware_Tools_and_Web-Based_Runtime_Platform/links/02e7e53c3c71b0b2a7000000/An-Educational-Environment-for-Digital-Testing-Hardware-Tools-and-Web-Based-Runtime-Platform.pdf
• An external test approach for network-on-a-chip switchesRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan2006 / p. 437-442 : ill http://dx.doi.org/10.1109/ATS.2006.23
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• An improved test generation approach for sequential circuits using decision diagramsBrik, Marina; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 155-158: ill
• An overview of expert system testing with remarks on distributed architectureParmakson, Priit; Tepandi, JaakProc. of the 11th Int. Scientific School on Distributed Information Systems Architecture, Wroclaw, 28.Jan.-1.Feb., 19901990
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• Analysis of a three-phase induction motor using the dynamic state space modelAsad, Bilal; Vaimann, Toomas; Belahcen, Anouar17th International Symposium “Topical Problems in the Field of Electrical and Power Engineering”. Doctoral school of energy and geotechnology. III : Kuressaare, Estonia, January 15-20, 20182018 / p. 65-69 : ill http://ise.elnet.ee/record=b2950017~S2*est
• Applicability of the energetic erosion theory to hardened steelsKleis, Ilmar; Remi, ToomasOST-03 Symposium on Machine Design2003 / p. 245-252 : ill
• Application of nanoindentation for constituent phases testing in ceramic–metal compositesHussainova, Irina; Jasiuk, Iwona; Hussainov, MedhatTechnical proceedings of the 2010 NSTI Nanotechnology Conference & Expo - Nanotech 2010. Vol. 1, Nanotechnology 2010 : Advanced materials, CNTs, Particles, Films and Composites2010 / p. 152-155 : ill
• Application of sequential test set compaction to LFSR reseedingAleksejev, Igor; Jutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings2008 / p. 102-107 : ill http://dx.doi.org/10.1109/NORCHP.2008.4738292
• An approach for verification assertions reuse 2 in RTL test pattern generationJenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Viilukas, Taavi; Fujiwara, HideoJournal of Shanghai Normal University : Natural Sciences2010 / p. 441-447 : ill https://www.researchgate.net/publication/240613999_An_Approach_for_Verification_Assertions_Reuse_in_RTL_Test_Pattern_Generation
• Approaches to improve hierarchical ATPG for synchronous sequential circuitsViilukas, TaaviInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kuuenda aastakonverentsi artiklite kogumik : 3.-5. oktoobril 2012, Laulasmaa2012 / p. 105-108 : ill
• Arterial pulse wave analysis during cold pressor test in patients with borderline hypertension [Electronic resource]Hlimonenko, Irina; Meigas, Kalju; Vahisalu, ReinIFMBE proceedings2005 / [5] p. [CD-ROM]
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• Aspect-oriented Model-based testing with UPPAAL timed automataVain, Jüri; Tsiopoulos, Leonidas; Kanter, GertModel and Data Engineering : 10th International Conference, MEDI 2021, Tallinn, Estonia, June 21–23, 2021 : proceedings2021 / p. 117-124 https://doi.org/10.1007/978-3-030-78428-7_10 https://www.scopus.com/sourceid/25674 https://www.scopus.com/record/display.uri?eid=2-s2.0-85111374940&origin=inward&txGid=a8e8c27dc616676de1ff54b83a071155
• Aspect-oriented testing of a rehabilitation systemSarna, Külli; Vain, JüriVALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France2014 / p. 73-78 : ill
• Assembling low-level tests to high-level symbolic test framesJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings [of the] 15th NORCHIP Conference, Tallinn, 10-11 November 19971997 / p. 275-280: ill
• Assessment of diagnostic test for automated bug localizationTihhomirov, Valentin; Tšepurov, Anton; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesLATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]2013 / [6] p. : ill
• Assessment of durability of environmentally friendly wood-based panelsKallavus, Urve; Järv, Hele; Kalamees, Targo; Kurik, LembitEnergy procedia2017 / p. 207–212 : ill https://doi.org/10.1016/j.egypro.2017.09.756 https://www.scopus.com/sourceid/17700156736 https://www.scopus.com/record/display.uri?eid=2-s2.0-85033382684&origin=inward&txGid=961b6368fff44c241d6c2121fb8b025b https://www.webofscience.com/wos/woscc/full-record/WOS:000426435500035
• Assessment of the potential of lubricated contact condition laboratory testing and surface analysis for improving the performance of machine elements. Comparison of model and real component test methodsAntonov, Maksim; Michalczewski, Remigiusz; Pasaribu, Richard; Piekoszewski, Witold18th International Baltic Conference : Engineering Materials & Tribology : BALTMATTRIB-2009 : October 22-23, 2009, Tallinn, Estonia : abstracts2009 / p. 55
• ATP-meetod mikroobse biomassi kiireks määramiseks ja selle kasutamine hügieeni testimisel toiduainetetööstusesKahru, Anne; Kurvet, Madis; Külm, I.EMS 96 teaduskonverents, 6.-7. juuni 1996, Tallinn = EMS 96 Scientific Conference, 6-7 June 1996, Tallinn1996 / poster 17
• At-speed functional built-in self-test methodology for processors [Electronic resource]Ubar, Raimund-Johannes; Indus, Viljar; Kalmend, OliverProceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka2012 / p. 168-172 : ill [CD-ROM]
• At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]
• At-speed testing and test quality evaluation for high-performance pipelined systems Töökiirusel testimine ja testi kvaliteedi hindamine kõrgjõudlus-konveierarhitektuuriga süsteemideleGorev, Maksim2015 https://digi.lib.ttu.ee/i/?3953
• At-speed testing of inter-die connections of 3D-SICs in the presence of shore logicShibin, Konstantin; Chickermane, Vivek; Keller, Brion; Papameletis, Christos; Marinissen, Erik Jan2015 Asian Test Symposium : ATS 2015 : 22-25 November 2015, Mumbai, Maharashtra, India : proceedings2015 / p. 79-84 : ill https://doi.org/10.1109/ATS.2015.21 https://www.scopus.com/sourceid/14494 https://www.scopus.com/record/display.uri?eid=2-s2.0-84963538046&origin=inward&txGid=4880e5666162ec99a8fd71cfcc83bda8 https://www.webofscience.com/wos/woscc/full-record/WOS:000386184700014
• Automated correction of design errors by edge redirection on high-level decision diagramsKarputkin, Anton; Ubar, Raimund-Johannes; Tombak, Mati; Raik, Jaan13th International Symposium on Quality Electronic Design (ISQED), 20122012 / p. 686-693 : ill https://ieeexplore.ieee.org/document/6113980
• Automated software-based in-field self-test program synthesisJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonInternational journal of microelectronics and computer science2017 / p. 57-64 : ill
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• Automated test program synthesis for digital systems with high-level decision diagramsUbar, Raimund-JohannesProc. of 7th International Conference2005 / p. 171-180
• Automated XML-based test modelling for mixed-signal circuitsMellik, AndresBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 203-204 : ill
• Automatic distribution of local testers for testing distributed systemsVain, Jüri; Halling, Evelin; Kanter, Gert; Anier, Aivo; Pal, DeepakDatabases and information systems IX : selected papers from the twelfth International Baltic Conference, DB&IS 20162016 / p. 297-310 : ill https://doi.org/10.3233/978-1-61499-714-6-297 https://www.scopus.com/sourceid/19500157321 https://www.scopus.com/record/display.uri?eid=2-s2.0-85030703059&origin=inward&txGid=e2b8d23c3197df5a63dc644219db590d https://www.webofscience.com/wos/woscc/full-record/WOS:000390305200022
• Automatic GUI model generation : state of the artKull, AndresISSREW 2012 : 23rd IEEE International Symposium on Software Reliability Engineering Supplemental Proceedings : 27-30 November 2012, Dallas, Texas, USA2012 / p. 207-212 https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6405443
• Automatic SoC level test path synthesis based on partial functional modelsTšertov, Anton; Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei2011 Asian Test Symposium (ATS) : New Delhi, India2011 / p. 532-538 https://ieeexplore.ieee.org/document/6114730
• Automatic synthesis of asynchronous circuits from synchronous RTL descriptionsÖberg, Johnny; Plosila, Juha; Ellervee, PeeterProceedings 23rd NORCHIP Conference : Oulu, Finland, 21-22 November 20052005 / p. 200-205 : ill https://ieeexplore.ieee.org/document/1597024/keywords#keywords
• Automatic system for testing of dynamic quality of PC plug-in A/D boardsPokorny, Martin; Roztocil, Jaroslav; Haasz, VladimirBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 61-62: ill
• Automatic test generation system for VLSIJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 19971997 / p. 255-258
• Automation of testing beyond the SoCsTšertov, Anton; Jutman, Artur; Devadze, SergeiInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis2010 / lk. 29-32 : ill
• Automation of the 3-phase induction motor type test place for industrial useKuusk, Leho; Laugis, JuhanBaltic electrical engineering review1998 / 1, p. 10-12
• Bbuzz : a Bit-aware fuzzing framework for network protocol systematic reverse engineering and analysisBlumbergs, Bernhards; Vaarandi, RistoMILCOM 2017 - 2017 IEEE Military Communications Conference : Baltimore, Maryland, USA, 23-25 October 20172017 / p. 707-712 https://doi.org/10.1109/MILCOM.2017.8170785 https://www.scopus.com/sourceid/87683 https://www.scopus.com/record/display.uri?eid=2-s2.0-85042351192&origin=inward&txGid=946f32681f64f02c9dfa9af856671f32 https://www.webofscience.com/wos/woscc/full-record/WOS:000426935700120
• Behavior of carbonate-rich fuels in AFBC and PFBC conditionsOts, Arvo; Arro, Hendrik; Pihu, Tõnu; Prikk, ArviProceedings of the 15th International Conference on Fluidized Bed Combustion : May 16-19, 1999, Savannah, Georgia [CD-ROM]1999 / 20 p https://www.osti.gov/biblio/20006717
• Behavioral level modeling of digital systems for testing purposesUbar, Raimund-Johannes42nd International Conference, Ilmenau, Germany, September 22-25, 1997. Part 11997 / p. 510-515
• A benchmark suite for evaluating the efficiency of test toolsKruus, Helena; Ubar, Raimund-Johannes; Ellervee, Peeter; Gorev, Maksim; Pesonen, Vadim; Devadze, Sergei; Orasson, Elmet; Brik, Marina; Min, Mart; Annus, Paul; Kruus, Margus; Meigas, KaljuBEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 / p. 85-88 : ill
• BIST analyzer : a training platform for SoC testing [Electronic resource]Jutman, Artur; Tšertov, Anton; Tšepurov, Anton; Aleksejev, Igor; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 20072007 / p. S3H-8-S3H-13 : ill. [CD-ROM] http://dx.doi.org/10.1109/FIE.2007.4418125
• A BIST scheme for testing mixed analogue and digital circuitsRobson, Malcolm; Russel, GordonBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 183-186: ill
• Built-in self diagnosis with multiple signature analyzers in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico2008 / p. 29-34 : ill
• A CAD system for teaching digital testUbar, Raimund-Johannes; Ivask, Eero; Paomets, Priidu; Raik, JaanBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 369-372: ill
• Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanMicroprocessors and microsystems2020 / art. 103117, 12 p https://doi.org/10.1016/j.micpro.2020.103117 https://www.scopus.com/sourceid/15552 https://www.scopus.com/record/display.uri?eid=2-s2.0-85086377299&origin=inward&txGid=f742e708555546cb12b9117a6e274d64 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROPROCESS%20MICROSY&year=2022 https://www.webofscience.com/wos/woscc/full-record/WOS:000571530400009
• Calculation of testability measures on structurally synthesized binary decision diagramsUbar, Raimund-Johannes; Heinlaid, J.; Raik, Jaan; Raun, L.BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 179-182: ill
• Case study in testing digital systemsUbar, Raimund-JohannesBaltic electronics1995 / 1, p. 24-27
• Case study-based performance evaluation of reactive planning testerKull, Andres; Raiend, Kullo; Vain, Jüri; Kääramees, MarkoModel-based Testing in Practice : 2nd Workshop on Model-based Testing in Practice(MoTiP 2009) : Enschede, The Netherlands, June 23, 2009 : proceedings2009 / p. 87-96 : ill https://www.etis.ee/Portal/Publications/Display/c507fc75-771f-419a-bf67-571af65fdb66
• Circular production, designing, and mechanical testing of polypropylene-based reinforced composite materials : statistical analysis for potential automotive and nuclear applicationsHussain, Abrar; Podgurski, Vitali; Goljandin, Dmitri; Antonov, Maksim; Sergejev, Fjodor; Krasnou, IlliaPolymers2023 / art. 3410, 30 p. : ill https://doi.org/10.3390/polym15163410 https://www.scopus.com/sourceid/54222 https://www.scopus.com/record/display.uri?eid=2-s2.0-85168802539&origin=inward&txGid=6902a351286c0e852be2e3d2d433ffb3 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=POLYMERS-BASEL&year=2023 https://www.webofscience.com/wos/woscc/full-record/WOS:001056196400001
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• Combined pseudo-exhaustive and deterministic testing of array multipliersOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 21st edition, 24th-26th May, Cluj-Napoca, Romania : proceedings2018 / 6 p. : ill https://doi.org/10.1109/AQTR.2018.8402708
• Combining dynamic slicing and mutation operators for ESL correctionRepinski, Urmas; Hantson, Hanno; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th-June 1st, 2012, Annecy, France2012 / [6] p. : ill https://ieeexplore.ieee.org/document/6233020
• Combining functional and structural approaches in test generation for digital systemsUbar, Raimund-JohannesMicroelectronics reliability1998 / 3, p. 317-329 : ill
• Combining learning, training and research in laboratory course for design and testUbar, Raimund-Johannes; Orasson, Elmet; Raik, Jaan; Wuttke, Heinz-DietrichThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 221-224 : ill https://www.researchgate.net/publication/242397131_Combining_Learning_Training_and_Research_in_Laboratory_Course_for_Design_and_Test
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• Fault oriented test pattern generation for sequential circuits using genetic algorithmsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop2000 / p. 319-320
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• Генерирование тестов по функциональной модели микропрограммного автоматаViilup, AguПроектирование и диагностика вычислительных средств1987 / с. 64-75 : илл https://www.ester.ee/record=b1273275*est
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