• Effective scalable IEEE 1687 instrumentation network for fault managementJutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE design & test2013 / p. 26-35 : ill https://doi.org/10.1109/MDAT.2013.2278535 https://www.scopus.com/sourceid/21100286806 https://www.scopus.com/record/display.uri?eid=2-s2.0-84900025438&origin=resultslist&sort=plf-f&src=s&sot=b&sdt=b&s=DOI%2810.1109%2FMDAT.2013.2278535%29&sessionSearchId=47e771afcc769678348f9a5b62e06fdd&relpos=0 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20DES%20TEST&year=2013 https://www.webofscience.com/wos/woscc/full-record/WOS:000328974800004
• Health management for self-aware SoCs based on IEEE 1687 infrastructureShibin, Konstantin; Devadze, Sergei; Jutman, Artur; Grabmann, Martin; Pricken, RobinIEEE Design & Test2017 / p. 27-35 : ill https://doi.org/10.1109/MDAT.2017.2750902 https://www.scopus.com/sourceid/21100286806 https://www.scopus.com/record/display.uri?eid=2-s2.0-85037723856&origin=inward&txGid=43952d2af7eb29d9046c148b7fce363e https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20DES%20TEST&year=2017 https://www.webofscience.com/wos/woscc/full-record/WOS:000416261800004
• Impact of orientation on the bias of SRAM-based PUFsAbideen, Zain Ul; Wang, Rui; Perez, Tiago Diadami; Schrijen, Geert-Jan; Pagliarini, Samuel NascimentoIEEE design & test2024 / p. 14-20 https://doi.org/10.1109/MDAT.2023.3322621