- A global methodology for test program generation starting from high level specificationsStorojev, Sergei; Leveugle, Regis; Saucier, GabrieleBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 305-311: ill
- A method for identification dynamic parameters of mixed signal circuitsZagursky, V.; Semyonova, N.; Gertners, A.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 211-215
- A method for testing dynamic characteristics of analog-digital converters in spectral domainZagursky, V.; Semyonova, N.; Gertners, A.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 207-210
- A trap detector for precise measurements of optical radiation powerKübarsepp, Toomas; Kärhä, PetriBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 195-200: ill
- Actual research topics in mechatronics system designGlesner, M.; Herpel, H.-J.; Kirschbaum, A.; Windirsch, P.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 85-91: ill
- Alternative graphs as a mathematical tool and knowledge representation for diagnosis purposes in digital systemsUbar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 285-292: ill
- An approach to model development for embedded testingTimohovich, E.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 353-358
- An interesting and effective code for error-correcting in mass-storage devicesSzepessy, AndrasBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 331-337
- Assurance of gain stability of spaceborne teleradiometersVeismann, Uno; Min, MartBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 179-185: ill
- A CAD system for teaching digital testUbar, Raimund-Johannes; Ivask, Eero; Paomets, Priidu; Raik, JaanBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 369-372: ill
- Chaos in electronic circuitsLindberg, ErikBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 29-37: ill
- Complementary Darlington circuitMännama, VelloBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 223-228: ill
- Constraints analysis in hierarchical test generation for digital systemsUbar, Raimund-Johannes; Krupnova, HelenaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 313-318: ill
- Design and application of lock-in instrumentsMin, MartBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 95-104: ill
- Different ways for optimization of settling time of the 3rd order phase locked loopTammemägi, JaakBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 239-243: ill
- Direct sequence spread spectrum digital radioKerek, Daniel; Saluvere, Teet; Tenhunen, HannuBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 159-167: ill
- Elektrodenübergangsimpedanz bei bioelektrischen MessungenMärtin, HannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / S. 147-150: Ill
- Elements of noise modeling in bipolar semiconductor devicesBlum, AlfonsBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 11-27
- Experimental study of ultrasonic microprocessor - based heat metersRagauskas, A.; Pamakstis, V.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 141-145: ill
- Fault aliasing of signature analyzersKemnitz, Günter; Kärger, ReinhardBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 339-346: ill
- Hierarchical test generation for finite state machinesBrik, Marina; Ubar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 319-324: ill
- Identification of signal's sine-wave dominants using analysis of level crossingsRonk, AntsBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 233-238: ill
- Infared and near-infared Fourier spectrometer PFS 2000 for analytical researchTõnnisson, T.; Lipping, Kalle; Pelt, Jaan; Raadi, G.; Randmets, R.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 169-172
- Information techniques for sensor- and microsystemsHolmer, R.; Tränkler, Hans-RolfBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 39-50: ill
- Intelligence system for design and investigation mechanical values sensorsShmakov, E.M.; Matveev, V.A.; Molotkov, S.V.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 261-269: ill
- Intelligent diagnostic centers: a new way to distributed fault-toleranceVarkonyi-Koczy, Annamaria R.; Tilly, K.; Dobrowiecki, Tadeusz; Vadasz, B.; Kiss, I.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 365-368: ill
- Low-noise CMOS-charge amplifier for a silicon strip detectorGrönlund, MarkoBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 217-222: ill
- MCM-testMagnhagen, Bengt; Linden, HenricBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 297-304: ill
- Measuring electrical bio-impedance - some practical aspectsEek, Andres; Ollmar, S.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / lk. 117-124: ill
- Modeling of blood flow measurement system elementsAdaškevicius, R.; Kopustinskas, A.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 125-131: ill
- Monitoring and problems of short-term prognosis in the field of plants protectionButkevicius, R.; Žilinskas, R.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 277-281
- New method and electronic system for the human brain hydrodynamic diagnosingRagauskas, A.; Daubaris, G.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 133-139: ill
- Non-invasive measurement and determination of structural vibration modes of precision controlled motion systemsKaušinis, Saulius; Isoda, AntanasBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 271-272: ill
- Parallel implementation of the recursive discrete Fourier transformationVarkonyi-Koczy, Annamaria R.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 111-115
- PLL based scanner stabilizerLipping, KalleBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 173-177: ill
- Sensors and systems for product data and product identification in CIMHenoch, BengtBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 51-64 : ill
- Simulation and automated test development system for digital devicesBirger, AlexanderBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 293-295
- Software development for programmable instrumentationUsk, AivarBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 255-260: ill
- Standards for radiometric calibration of electro-optical devices in EstoniaVeismann, Uno; Pehk, M.; Kübarsepp, ToomasBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 187-193: ill
- Stepwise Lock-In Signal ConversionParve, ToomasBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 245-254: ill
- Synchronous detector with MOSFETsKuusik, AlarBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 229-232: ill
- Synthesis of hierarchically testable FSM networksKasirova, Lilia; Keevallik, Andres; Kruus, MargusBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 347-352: ill
- Test generation for control faults in digital systemsDušina, Julia; Brik, MarinaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 325-330: ill
- The analysis of integrating sigma-delta ADC noiseGutnikov, V.S.; Krivchenko, T.I.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 201-206: ill
- The contribution of the artificial intelligence to the measurement scienceDobrowiecki, Tadeusz; Louage, Frank; Pataki, BelaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 105-110: ill
- The method of conformance testing for presentation data transfer syntaxShevelkov, V.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 359-364: ill
- The realization of the synchronous signal conditioning and demodulating systemLand, RaulBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 151-158: ill
- Trends in artificial intelligence applications for real-time control : (a speculative study)Mõtus, LeoBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 71-83
- Ultrasonic sensors - an intelligent sensor principle for many applicationsMagori, V.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 65-70: ill