- IEEE 1687 compliant ecosystem for embedded instrumentation access and in-field health monitoringTšertov, Anton; Jutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE AUTOTESTCON 2018 : National Harbor, September 17-20, 2018 : proceedings2018 / 9 p.: ill https://doi.org/10.1109/AUTEST.2018.8532559
- IEEE P1687 IJTAG demonstrator on FPGAShibin, Konstantin; Aleksejev, Igor; Jutman, Artur; Devadze, SergeiDATE 2012 University Booth : Design Automation and Test in Europe : Dresden, Germany, March 12-16, 20122012 / 1 p. : ill https://www.academia.edu/22101517/IEEE_P1687_IJTAG_demonstrator_on_FPGA
- Invited paper: System-Wide Fault Management based on IEEE P1687 IJTAGJutman, Artur; Devadze, Sergei; Aleksejev, Jevgeni6th International Workshop on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC) : 20-22 June 2011, Montpeillier, France2011 / [4] p.: ill https://ieeexplore.ieee.org/document/5981520
- Optimization of boundary scan tests using FPGA-based efficient scan architecturesAleksejev, Igor; Devadze, Sergei; Jutman, Artur; Shibin, KonstantinJournal of electronic testing : theory and applications (JETTA)2016 / p. 245-255 : ill https://doi.org/10.1007/s10836-016-5588-y https://www.scopus.com/sourceid/18040 https://www.scopus.com/record/display.uri?eid=2-s2.0-84964452131&origin=inward&txGid=035b6825dd1a37b925ec9c823fcecd7d https://jcr.clarivate.com/jcr-jp/journal-profile?journal=J%20ELECTRON%20TEST&year=2016 https://www.webofscience.com/wos/woscc/full-record/WOS:000377449900002
- Reliable health monitoring and fault management infrastructure based on embedded instrumentation and IEEE 1687Jutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings2016 / p. 240-249 : ill https://doi.org/10.1109/AUTEST.2016.7589605
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