• Applications of the open source HW design framework zamiaCADTšepurov, Anton; Tihhomirov, Valentin; Saif Abrar, Syed; Jenihhin, Maksim; Raik, JaanDATE 2012 University Booth : Design Automation and Test in Europe : Dresden, Germany, March 12-16, 20122012 / 1 p
• A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMsCardoso Medeiros, Guilherme; Gürsoy, Cemil Cem; Fieback, Moritz; Wu, Lizhou; Jenihhin, Maksim; Taouil, Mottaqiallah; Hamdioui, Said2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings2020 / p. 792-797 https://doi.org/10.23919/DATE48585.2020.9116278
• Fast and optimized task allocation method for low vertical link density 3-Dimensional Networks-on-Chip based many core systemsYing, Haoyuan; Hollstein, Thomas; Hofmann, KlausProceedings : Design, Automation & Test in Europe : Grenoble, France, March 18-22, 20132013 / p. 1777-1782 : ill
• IEEE P1687 IJTAG demonstrator on FPGAShibin, Konstantin; Aleksejev, Igor; Jutman, Artur; Devadze, SergeiDATE 2012 University Booth : Design Automation and Test in Europe : Dresden, Germany, March 12-16, 20122012 / 1 p. : ill https://www.academia.edu/22101517/IEEE_P1687_IJTAG_demonstrator_on_FPGA
• A rescue demonstrator for interdependent aspects of reliability, security and quality towards a complete EDA flowRaik, Jaan; Jenihhin, Maksim2020 Design, Automation & Test in Europe Conference &Exhibition (DATE) : proceedings2020 / p. 58 https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=9116424
• RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systemsJenihhin, Maksim; Raik, Jaan2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings2020 / art. 19690741 , 6 p https://doi.org/10.23919/DATE48585.2020.9116558
• A synthesis-agnostic behavioral fault model for high gate-level fault coverageKarputkin, Anton; Raik, Jaan2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings2016 / p. 1124-1127 : ill https://ieeexplore.ieee.org/document/7459477/figures#figures