Riistvara turvalisuse keskus
TalTech prioriteetne teadussuund
Klassifikaator (Frascati)
Uurimisrühma juht
Uurimisrühma liige
Doktorant
Võtmesõna
riistvara turvalisus
usaldatavad kiibid
rakendusspetsiifilised integraallülitused
riistvara krüptomoodulid
integraallülituste hägustamise (obfuskeerimise) meetodid
Ülevaade
Riistvara turvalisuse keskus viib läbi uuringuid kõigis riistvara turvalisuse rakenduslikes aspektides: keskuse teadustöö eesmärk on turvalisuse valideerimise tehnikad reaalsetes ränikiipides. Keskuse uurimistöö integraalskeemide projekteerimise, elektroonilise projekteerimise automatiseerimise (EDA) ja krüptograafilise riistvara vallas võimaldab luua usaldusväärseid riistvarapõhiseid süsteeme. Ohud nagu riistvara troojalased, pöördprojekteerimine, integraalskeemi paigutuse hägustamine, IPpiraatlus, integraalskeemide ületootmine, külgkanali rünnakud jne lahendatakse mitmesuguste tehniliste vastumeetmete abil.Keskuse põhikompetentsid:• rakendusspetsiifiliste integraallülituste projekteerimine• integraalskeemi paigutuse hägustamine projekti tükeldamise teel (Split-Chip ja Split-Fab)• usaldusväärse elektroonilise projekteerimise automatiseerimise töövoog (alates RTL-ist kuni paigutuseni)• vastumeetmed pöördprojekteerimisele, külgkanali rünnakutele ja piraatlusele• krüpto-riistvara, k.a. konventsionaalne ja postkvantkrüptograafia
Seotud projektid
Uurimisrühma tegevusperiood
2023
2022
2021
2020
2019
Seotud struktuuriüksus
Teadusgrupiga seotud publikatsioonid
- Perez, T., Pagliarini, S. Hardware trojan insertion in finalized layouts : from methodology to a silicon demonstration // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2023) vol. 42, 7, p. 2094-2107.
https://doi.org/10.1109/TCAD.2022.3223846 - Aikata, A., Mert, A. C., Imran, M., Pagliarini, S., Roy, S. S. KaLi: a crystal for post-quantum security using kyber and dilithium // IEEE Transactions on Circuits and Systems I : regular papers (2022) vol. 70, 2, p. 747–758.
https://doi.org/10.1109/TCSI.2022.3219555 - Aksoy, L., Roy, D. B., Imran, M., Karl, P., Pagliarini, S. Multiplierless design of very large constant multiplications in cryptography // IEEE Transactions on Circuits and Systems II : Express Briefs (2022) vol. 69, 11, p. 4503-4507.
https://doi.org/10.1109/TCSII.2022.3191662 - Pagliarini, S., Benites, L., Martins, M., Rech, P., Kastensmidt, F. Evaluating architectural, redundancy, and implementation strategies for radiation hardening of FinFET integrated circuits // IEEE transactions on nuclear science (2021) vol. 68, 5, p. 1045-1053.
https://doi.org/10.1109/TNS.2021.3070643 - Imran, M., Abideen, Z.U., Pagliarini, S. An open-source library of large integer polynomial multipliers // 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Vienna, Austria, April 7-9 2021. : IEEE, 2021. p. 145-150 : ill.
https://doi.org/10.1109/DDECS52668.2021.9417065 - Perez, T.D., Pagliarini, S.N. A survey on split manufacturing : attacks, defenses, and challenges // IEEE Access (2020) vol. 8, p. 184013-184035.
https://doi.org/10.1109/ACCESS.2020.3029339 - Sweeney, J., Mohammed Zackriya, V., Pagliarini, S., Pileggi, L. Latch-Based logic locking // Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2020. Danvers : IEEE, 2020. p. 132−141 : ill.
https://doi.org/10.1109/HOST45689.2020.9300256 - Imran, M., Pagliarini, S., Rashid, M. An area aware accelerator for elliptic curve point multiplication // 27th IEEE International Conference on Electronics Circuits and Systems, (ICECS) 2020, Glasgow, UK, Virtual Conference, November 23-25, 2020 : proceedings. Danvers : IEEE, 2020. 4 p.
https://doi.org/10.1109/ICECS49266.2020.9294908 - Hafeez, M.A., Rashid, M., Tariq, H., Abideen, Z.U., Alotaibi, S.S., Sinky, M.H. Performance improvement of decision tree : a robust classifier using tabu search algorithm // Applied Sciences (Switzerland) (2021) Vol. 11, 15, art. 6728.
https://doi.org/10.3390/app11156728 - Rashid, M., Imran, M., Jafri, A. R., Mehmood, Z. A 4-Stage pipelined architecture for point multiplication of binary huff curves // Journal of circuits, systems, and computers (2020) vol. 29, 11, art. 2050179.
https://doi.org/10.1142/S0218126620501790 - Imran, M., Abideen, Z.U., Pagliarini, S. An experimental study of building blocks of lattice-based NIST post-quantum cryptographic algorithms // Electronics (2020) vol. 9, 11, art. 1953, 26 p. : ill.
https://doi.org/10.3390/electronics9111953 - Perez, T.D., Imran, M., Vaz, P., Pagliarini, S.N. Side-channel Trojan insertion - a practical foundry-side attack via ECO // 2021 IEEE International Symposium on Circuits and Systems (ISCAS), Daegu, Korea, May 22-28, 2021 : proceedings. Danvers : IEEE, 2021. 5 p. : ill.
https://doi.org/10.1109/ISCAS51556.2021.9401481 - Abideen, Z. U., Perez, T. D., Pagliarini, S. From FPGAs to obfuscated eASICs : design and security trade-offs // IEEE Asian Hardware-Oriented Security and Trust (AsianHOST). : IEEE, 2021. p. 1-4.
https://doi.org/10.1109/AsianHOST53231.2021.9699758 - Hepp, A., Perez, T., Pagliarini, S., Sigl, G. A pragmatic methodology for blind hardware trojan insertion in finalized layouts // ICCAD '22: Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design. New York : IEEE, 2022. art. 69, p. 1-9 : ill.
https://doi.org/10.1145/3508352.3549452 - Aksoy, L., Nguyen, Q.-L., Almeida, F., Raik, J., Flottes, M.-L., Dupuis, S., Pagliarini, S. High-level intellectual property obfuscation via decoy constants // 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) : Torino, Italy, 28-30 June 2021. : IEEE, 2021. p. 1-7.
https://doi.org/10.1109/IOLTS52814.2021.9486714 - Abideen, Z.U., Rashid, M. EFIC-ME : a fast emulation based fault injection control and monitoring enhancement // IEEE Access (2020) vol. 8, p. 207705-207716.
https://doi.org/10.1109/ACCESS.2020.3038198 - Sajid, A., Rashid, M., Jamal, S.S., Imran, M., Alotaibi, S.S., Sinky, M.H. Areeba : an area efficient binary huff-curve architecture // Electronics (Switzerland) (2021) Vol. 10, 12, art. 1490.
https://doi.org/10.3390/electronics10121490 - Almeida, F., Imran, M., Raik, J., Pagliarini, S. Ransomware attack as Hardware Trojan : a feasibility and demonstration study // IEEE Access (2022) vol. 10, p. 44827-44839.
https://doi.org/10.1109/ACCESS.2022.3168991 - Aljafar, M. J., Acken, J. M. A 3-D crossbar architecture for both pipeline and parallel computations // IEEE Transactions on Circuits and Systems I : regular papers (2021) vol. 68, 11, p. 4456-4469.
https://doi.org/10.1109/TCSI.2021.3108564 https://pdxscholar.library.pdx.edu/cgi/viewcontent.cgi?article=1680&context=ece_fac - Pagliarini, S., Sweeney, J., Mai, K. et al. Split-chip design to prevent IP reverse engineering // IEEE Design and Test (2020) vol. 38, 4, p. 109-118.
https://doi.org/10.1109/MDAT.2020.3033255 - Aljafar, M. J., Acken, J. M. Survey on the benefits of using memristors for PUFs // International Journal of Parallel, Emergent and Distributed Systems (2022) vol. 37, 1, p. 40-67.
https://doi.org/10.1080/17445760.2021.1972295 - Basiashvili, G., Abideen, Z.U., Pagliarini, S. Obfuscating the hierarchy of a digital IP // Embedded Computer Systems : Architectures, Modeling, and Simulation :22nd International Conference, SAMOS 2022, Samos, Greece, July 3-7, 2022 : proceedings. Cham : Springer, 2022. p. 303-314. (Lecture notes in computer science ; 13511).
https://doi.org/10.1007/978-3-031-15074-6_28 - Di Natale, G., Regazzoni, F., Albanese, V., Pagliarini, S. et al. Latest trends in hardware security and privacy // 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : ESA-ESRIN, Italy (On-line Virtual Event),October 19–21, 2020. : IEEE, 2020. 4 p. : ill.
https://doi.org/10.1109/DFT50435.2020.9250816 - Perez, T., Pagliarini, S. A side-channel hardware trojan in 65nm CMOS with 2μW precision and multi-bit leakage capability // 2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC) : 17-20 January 2022 : Taipei, Taiwan. : IEEE, 2022. p. 9-10 : ill.
https://doi.org/10.1109/ASP-DAC52403.2022.9712490 - Eslami, M., Ghasempouri, T., Pagliarini, S. Reusing verification assertions as security checkers for Hardware Trojan detection // 2022 23rd International Symposium on Quality Electronic Design (ISQED), Santa Clara, CA, USA : 06-07 April 2022. : IEEE, 2022. p. 1-6 : ill.
https://doi.org/10.1109/ISQED54688.2022.9806292 - Aksoy, L., Hepp, A., Baehr, J., Pagliarini, S. Hardware obfuscation of digital FIR filters // 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) : Prague, Czech Republic : April 6-8, 2022 : proceedings. : IEEE, 2022. p. 68-73.
https://doi.org/10.48550/arXiv.2202.10022 https://doi.org/10.1109/DDECS54261.2022.9770141 - Almeida, F., Aksoy, L., Raik, J., Pagliarini, S. Side-channel attacks on triple modular redundancy schemes // 2021 IEEE 30th Asian Test Symposium ATS 2021 : proceedings. : IEEE, 2021. p. 79-84 : ill.
https://doi.org/10.1109/ATS52891.2021.00026 - Grailoo, M., Leier, M., Pagliarini, S. Hardware Trojans for confidence reduction and misclassifications on neural networks // Proceedings Of The Twenty Third International Symposium On Quality Electronic Design (ISQED 2022). Danvers : IEEE, 2022. art. 180541, p. 230-235. (International Symposium on Quality Electronic Design).
https://doi.org/10.1109/ISQED54688.2022.9806246 - Perez, T.D., Gonçalves, M.M., Gobatto, L., Brandalero, M., Azambuja, J.R., Pagliarini, S. G-GPU : a fully-automated generator of GPU-like ASIC accelerators // 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 14-23 March 2022 : Antwerp, Belgium. : IEEE, 2022. p. 544 - 547.
https://doi.org/10.23919/DATE54114.2022.9774758 - Aljafar, M.J., Azaïs, F., Flottes, M-L., Pagliarini, S. Leveraging layout-based effects for locking analog ICs // ASHES'22: Proceedings of the 2022 Workshop on Attacks and Solutions in Hardware Security. New York : Association for Computing Machinery, 2022. p. 5-13.
https://doi.org/10.1145/3560834.3563826 - Pagliarini, S. A tutorial on design obfuscation : from transistors to systems // 2021 IEEE 22nd Latin American Test Symposium (LATS), Punta del Este, Uruguay, 27-29 October 2021. : IEEE, 2021. 3 p. : ill.
https://doi.org/10.1109/LATS53581.2021.9651741 - Farahmandi, F., Sinanoglu, O., Blanton, R., Pagliarini, S. Design obfuscation versus test // 2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25 - 29, 2020, Tallinn, Estonia. Danvers : IEEE, 2020. 10 p.
https://doi.org/10.1109/ETS48528.2020.9131590