SiC-diodes forward surge current failure mechanisms : experiment and simulation
autor
vastutusandmed
E. Velmre, A. Udal
allikas
ESREF'97 : proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct. 7-10, 1997, Bordeaux, France
ilmumiskoht
[S.l.]
ilmumisaasta
leheküljed
p. 1671-1674
konverentsi nimetus, aeg
The 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct. 7-10, 1997
konverentsi toimumispaik
Bordeaux, France
märksõna
TTÜ struktuuriüksus
keel
inglise
Velmre, E., Udal, A. SiC-diodes forward surge current failure mechanisms : experiment and simulation // ESREF'97 : proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct. 7-10, 1997, Bordeaux, France. [S.l.], 1997. p. 1671-1674.