NoCDepend : a flexible and scalable dependability technique for 3D networks-on-chip
                                            vastutusandmed
                                    
                                    
Thomas Hollstein, Siavoosh Payandeh Azad, Thilo Kogge, Haoyuan Ying, Klaus Hofmann
                                                    
                                            
                                            ilmumiskoht
                                    
                                    
Los Alamitos
                                                    
                                            
                                            kirjastus/väljaandja
                                    
                                    
                                
                                            ilmumisaasta
                                    
                                    
                                
                                            leheküljed
                                    
                                    
p. 75-78 : ill
                                                    
                                            
                                            konverentsi nimetus, aeg
                                    
                                    
18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015, 22-24 April 2015
                                                    
                                            
                                            konverentsi toimumispaik
                                    
                                    
Belgrade, Serbia
                                                    
                                            
                                            ISBN
                                    
                                    
978-1-4799-6780-3
                                                    
                                            
                                            märkused
                                    
                                    
Bibliogr.: 17 ref
                                                    
                                            
                                            TTÜ struktuuriüksus
                                    
                                    
                                
                                            keel
                                    
                                    
inglise
                                                    
                                            
                            Hollstein, T., Azad, S.P., Kogge, T., Ying, H., Hofmann, K. NoCDepend : a flexible and scalable dependability technique for 3D networks-on-chip // 2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings. Los Alamitos : IEEE Computer Society, 2015. p. 75-78 : ill.