A hybrid BIST architecture and its optimization for SoC testing
vastutusandmed
Gert Jervan, Zebo Peng, Raimund Ubar, Helena Kruus
allikas
Proceedings of the 3rd International Symposium on Quality Electronic Design : ISQED 2002, March 18-21, 2002, San Jose, California
ilmumiskoht
Washington
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 273-279 : ill
ISBN
0-7695-1561-4
märkused
Bibliogr.: 15 ref
keel
inglise
Jervan, G., Peng, Z., Ubar, R.-J., Kruus, H. A hybrid BIST architecture and its optimization for SoC testing // Proceedings of the 3rd International Symposium on Quality Electronic Design : ISQED 2002, March 18-21, 2002, San Jose, California. Washington : IEEE Computer Society, 2002. p. 273-279 : ill.