Testability-based parameter measurement of analog measuring circuits in the frequency domain
autor
Liu, Ji-Gou
Frühauf, Uwe
vastutusandmed
Ji-Gou Liu and Uwe Frühauf
allikas
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
ilmumiskoht
[Tallinn]
ilmumisaasta
1998
leheküljed
p. 329-332: ill
ISBN
9985-59-081-3
märkused
Bibl. 8 ref