Test generation for sequential digital systems based on symbolic simulation
autor
Skobtsov, Vadim
Skobtsov, Yu.
vastutusandmed
V.Skobtsov, Yu.Skobtsov
allikas
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
ilmumiskoht
[Tallinn]
ilmumisaasta
1998
leheküljed
p. 341-344: ill
ISBN
9985-59-081-3
märkused
Bibl. 7 ref