Fault diagnosis in the BIST environment based on bisection of detected faults
vastutusandmed
Raimund Ubar, Sergei Kostin, Jaan Raik
allikas
LATW2007 : 8th IEEE Latin-American Test Workshop : March 11-14, 2007, Cuzco, Peru
ilmumiskoht
[S.l.]
ilmumisaasta
leheküljed
[6] p. : ill
märkused
Bibliogr.: 16 ref
keel
inglise
Ubar, R.-J., Kostin, S., Raik, J. Fault diagnosis in the BIST environment based on bisection of detected faults // LATW2007 : 8th IEEE Latin-American Test Workshop : March 11-14, 2007, Cuzco, Peru. [S.l.], 2007. [6] p. : ill.